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| HCC/HCF4014B HCC/HCF4021B 8-STAGE STATIC SHIFT REGISTERS 4014B 4021B SYNCHRONOUS PARALLEL OR SERIAL INPUT/SERIAL OUTPUT lines and synchronous with the positive transition of the clock line. In the HCC/HCF4021B, the CLOCK input of the internal stage is "forced" whenasynchronous parallel entry is made. Register expansion using multiple package is permitted. .MEDI .FULLYSTATI .8 .QUI .5V,10VAND15VPARAMETRI .I .100%TESTEDFORQUI .MEETSALLREQUI ASYNCHRONOUS PARALLEL INPUT OR SYNCHRONOUS SERIAL INPUT/SERIAL OUTPUT UM-SPEED OPERATION-12MHz (typ.) CLOCK RATE AT VDD - VSS = 10V C OPERATION MASTER-SLAVE FLIP-FLOPS PLUS OUTPUT BUFFERING AND CONTROL GATING ESCENT CURRENT SPECIFIED TO 20V FOR HCC DEVICE C RATINGS NPUT CURRENT OF 100nA AT 18V AND 25C FOR HCC DEVICE ESCENT CURRENT REMENTS OF JEDEC TENTATIVE STANDARD No 13A, "STANDARD SPECIFICATIONS FOR DESCRIPTION OF "B" SERIES CMOS DEVICES" EY (Plastic Package) F (Ceramic Package) M1 (Micro Package) C1 (Plastic Chip Carrier) DESCRIPTION The HCC4014B, HCC4021B (extended temperature range) and the HCF4014B, HCF4021B (intermediate temperature range) are monolithic integrated circuits, available in 16-lead dual in-line plastic or ceramic package and plastic micro package. The HCC/HCF4014B and HCC/HCF4021B series types are 8-stage parallel-or serial-input/serial-output registers having common CLOCK and PARALLEL/SERIAL CONTROL inputs, a single SERIAL data input, and individual parallel "JAM" inputs to each register stage. Each register stage is a D type, master-slave flip-flop in addition to an output from stage 8, "Q" outputs are also available from stages 6 and 7. Parallel as well as serial entry is made into the register synchronously with the positive clock line transition in the HCC/HCF4014B. In the HCC/HCF4021B serial entry is synchronous with the clock but parallel entry is asynchronous. In both types, entry is controlled by the PARALLEL/SERIAL CONTROL input. When the PARALLEL/SERIAL CONTROL input is low, data is serially shifted into the 8-stage register synchronously with the positive transition of the clock line. When the PARALLEL/SERIAL CONTROL input is high, data is jammed into the 8-stage register via the parallel input November 1996 ORDER CODES : HCC40XXBF HCF40XXBM1 HCF40XXBEY HCF40XXBC1 PIN CONNECTIONS 1/13 HCC/HCF4014B/4021B FUNCTIONAL DIAGRAM ABSOLUTE MAXIMUM RATINGS Symbol V DD * Vi II Pto t Parameter Supply Voltage : HC C Types H CF Types Input Voltage DC Input Current (any one input) Total Power Dissipation (per package) Dissipation per Output Transistor for T o p = Full Package-temperature Range Operating Temperature : HCC Types H CF Types Storage Temperature Value - 0.5 to + 20 - 0.5 to + 18 - 0.5 to V DD + 0.5 10 200 100 - 55 to + 125 - 40 to + 85 - 65 to + 150 Unit V V V mA mW mW C C C T op T stg Stresses above those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for external periods may affect device reliability. * All voltage values are referred to VSS pin voltage. RECOMMENDED OPERATING CONDITIONS Symbol V DD VI Top Parameter Supply Voltage : HCC Types HC F Types Input Voltage Operating Temperature : HCC Types H CF Types Value 3 to 18 3 to 15 0 to V DD - 55 to + 125 - 40 to + 85 Unit V V V C C 2/13 HCC/HCF4014B/4021B LOGIC DIAGRAMS 4014B 4021B 3/13 HCC/HCF4014B/4021B TRUTH TABLES HCC/HCF 4014B CL - -/ - -/ - -/ - -/ - -/ - -/ -\ - Q1 Serial Parallel/ Pl- 1 Pl- n Qn Input Serial (internal) Control X X X X 0 1 X 1 1 1 1 0 0 X 0 1 0 1 X X X 0 0 1 1 X X X 0 1 0 1 0 1 Q1 0 0 1 1 Q n -1 Q n -1 I Qn NC HCC/HCF4021B CL X X X X -/ -\ - - Serial Parallel/ Q1 Qn Pl- 1 Pl- n (internal) Input Serial Control X X X X 0 1 X 1 1 1 1 0 0 0 0 0 1 1 X X X 0 1 0 1 X X X 0 0 1 1 0 1 Q1 0 1 0 1 Q n -1 Q n -1 I Qn NC X = don't care case. NC = no change . X = don't care case. NC = no change. STATIC ELECTRICAL CHARACTERISTICS (over recommended operating conditions) Test Conditions Symbol Parameter VI (V) 0/ 5 HCC Types 0/15 0/20 0/ 5 HCF 0/10 Types 0/15 VOH Output High Voltage 0/ 5 0/10 0/15 VOL Output Low Voltage 5/0 10/0 15/0 VIH Input High Voltage 0.5/4.5 1/9 4.5/0.5 9/1 <1 <1 <1 <1 <1 <1 <1 <1 <1 <1 0/10 VO (V) | IO | V DD (A) (V) 5 10 15 20 5 10 15 5 10 15 5 10 15 5 10 15 5 10 15 3.5 7 11 1.5 3 4 4.95 9.95 14.95 0.05 0.05 0.05 3.5 7 11 1.5 3 4 TLow* Min. Max. Min. 5 10 20 100 20 40 80 4.95 9.95 14.95 0.05 0.05 0.05 3.5 7 11 1.5 3 4 V V Value 25 C Typ. 0.04 0.04 0.04 0.08 0.04 0.04 0.04 5 10 20 100 20 40 80 4.95 9.95 14.95 0.05 0.05 0.05 V V T High* Max. Min. Max. 150 300 600 3000 150 300 600 A Unit IL Quiescent Current 1.5/13.5 < 1 VIL Input Low Voltage 13.5/1.5 < 1 * TLow = - 55C for HCC device : - 40C for HCF device. * THigh = + 125C for HCC device : + 85C for HCF device. The Noise Margin for both "1" and "0" level is : 1V min. with VDD = 5V, 2V min. with VDD = 10V, 2.5 V min. with VDD = 15V. 4/13 HCC/HCF4014B/4021B STATIC ELECTRICAL CHARACTERISTICS (continued) Test Conditions Symbol Parameter VI (V) 0/ 5 HCC 0/ 5 Types 0/10 0/15 0/ 5 0/ 5 HCF Types 0/10 0/15 I OL Output Sink Current 0/ 5 HCC 0/10 Types 0/15 0/ 5 HCF 0/10 Types 0/15 I IH , I IL Input Leakage Current HCC 0/18 Types HCF 0/15 Types Any Input VO (V) 2.5 4.6 9.5 13.5 2.5 4.6 9.5 13.5 0.4 0.5 1.5 0.4 0.5 1.5 Value Unit |I O | V D D T L o w* 25 C T Hi g h * (A) (V) Min. Max. Min. Typ. Max. Min. Max. 5 5 10 15 5 5 10 15 5 10 15 5 10 15 18 Any Input 15 -2 - 0.64 - 1.6 - 4.2 - 1.53 - 0.52 - 1.3 - 3.6 0.64 1.6 4.2 0.52 1.3 3.6 0.1 0.3 - 1.6 - 3.2 - 0.51 - 1 - 1.3 - 2.6 - 3.4 - 6.8 - 1.36 - 3.2 - 0.44 - 1 - 1.1 - 2.6 - 3.0 - 6.8 0.51 1.3 3.4 0.44 1.1 3.0 1 2.6 6.8 1 2.6 6.8 10 -5 I OH Output Drive Current - 1.15 - 0.36 - 0.9 - 2.4 - 1.1 - 0.36 - 0.9 - 2.4 0.36 0.9 2.4 0.36 0.9 2.4 0.1 1 1 A mA mA 10 - 5 0.3 5 7.5 CI Input Capacitance pF * TLow = - 55C for HCC device : - 40C for HCF device. * THigh = + 125C for HCC device : + 85C for HCF device. The Noise Margin for both "1" and "0" level is : 1V min. with VDD = 5V, 2V min. with VDD = 10V, 2.5 V min. with VDD = 15V. DYNAMIC ELECTRICAL CHARACTERISTICS (T amb = 25C, C L = 50pF, R L = 200k, typical temperature coefficient for all V DD = 0.3%/C values, all input rise and fall time = 20ns) Symbol Parameter Test Conditions V D D (V) Min. 5 10 15 t THL , t T L H Transition Time 5 10 15 f CL * Maximum Clock Input Frequency 5 10 15 tW Clock Pulse Width 5 10 15 3 6 8.5 180 80 50 Value Typ. 160 80 60 100 50 40 6 12 17 90 40 25 ns MHz Max. 320 160 120 200 100 80 ns ns Unit CLOCKED OPERATION t P L H , t P HL Propagation Delay Time * If more than one unit is cascaded t rCL should be made less than or equal to the sum of the transition time and the fixed propaga tion delay of the output of the driving stage of the estimated capacitive load. 5/13 HCC/HCF4014B/4021B DYNAMIC ELECTRICAL CHARACTERISTICS (Continued) Symbol Parameter Test Conditions VDD (V) 5 10 15 5 10 15 5 10 15 5 10 15 5 10 15 5 10 15 5 10 15 5 10 15 Min. Value Typ. Max. 15 15 15 120 80 60 80 50 40 50 30 20 180 80 60 0 0 0 160 80 50 280 140 100 60 40 30 40 25 20 25 15 10 90 40 30 Unit CLOCKED OPERATION Clock Input Rise or Fall Time tr, tf s tsetup Setup Time, serial Input (ref. to CL) ns tsetup Setup Time, parallel Input (4014B) (ref. to CL) Setup Time, parallel Input (4021B) (ref. to P/S) Setup Time, parallel/serial Control (4014B) (ref. to CL) Hold Time, serial in, parallel in, parallel/serial Cotrol P/S Pulse Width (4021B) ns tsetup ns tsetup ns thold ns 80 40 25 140 70 50 tWH ns trem P/S Removal time (4021B) (ref. to CL) ns * If more than one unit is cascaded trCL should be made less than or equal to the sum of the transition time and the fixed propaga tion delay of the output of the driving stage of the estimated capacitive load. Typical Output Low (sink) Current Characteristics. Minimum Output Low (sink) Current Characteristics. 6/13 HCC/HCF4014B/4021B Typical Output High (source) Current Characteristics. Minimum Output High (source) Current Characteristics. Typical Transition Time vs. Load Capacitance. Typical Propagation Delay Time vs. Load Capacitance. Typical Dynamic Power Dissapating vs. Clock Input Frequency. 7/13 HCC/HCF4014B/4021B TEST CIRCUITS Quiescent Device Current. Noise Immunity. Input Leakage Current. Dynamic Power Dissipation. 8/13 HCC/HCF4014B/4021B Plastic DIP16 (0.25) MECHANICAL DATA mm MIN. a1 B b b1 D E e e3 F I L Z 3.3 1.27 8.5 2.54 17.78 7.1 5.1 0.130 0.050 0.51 0.77 0.5 0.25 20 0.335 0.100 0.700 0.280 0.201 1.65 TYP. MAX. MIN. 0.020 0.030 0.020 0.010 0.787 0.065 inch TYP. MAX. DIM. P001C 9/13 HCC/HCF4014B/4021B Ceramic DIP16/1 MECHANICAL DATA mm MIN. A B D E e3 F G H L M N P Q 7.8 2.29 0.4 1.17 0.22 0.51 0.38 17.78 2.79 0.55 1.52 0.31 1.27 10.3 8.05 5.08 0.307 0.090 0.016 0.046 0.009 0.020 3.3 0.015 0.700 0.110 0.022 0.060 0.012 0.050 0.406 0.317 0.200 TYP. MAX. 20 7 0.130 MIN. inch TYP. MAX. 0.787 0.276 DIM. P053D 10/13 HCC/HCF4014B/4021B SO16 (Narrow) MECHANICAL DATA DIM. MIN. A a1 a2 b b1 C c1 D E e e3 F G L M S 3.8 4.6 0.5 9.8 5.8 1.27 8.89 4.0 5.3 1.27 0.62 8 (max.) 0.149 0.181 0.019 10 6.2 0.35 0.19 0.5 45 (typ.) 0.385 0.228 0.050 0.350 0.157 0.208 0.050 0.024 0.393 0.244 0.1 mm TYP. MAX. 1.75 0.2 1.65 0.46 0.25 0.013 0.007 0.019 0.004 MIN. inch TYP. MAX. 0.068 0.007 0.064 0.018 0.010 P013H 11/13 HCC/HCF4014B/4021B PLCC20 MECHANICAL DATA mm MIN. A B D d1 d2 E e e3 F G M M1 1.27 1.14 7.37 1.27 5.08 0.38 0.101 0.050 0.045 9.78 8.89 4.2 2.54 0.56 8.38 0.290 0.050 0.200 0.015 0.004 TYP. MAX. 10.03 9.04 4.57 MIN. 0.385 0.350 0.165 0.100 0.022 0.330 inch TYP. MAX. 0.395 0.356 0.180 DIM. P027A 12/13 HCC/HCF4014B/4021B Information furnished is believed to be accurate and reliable. However, SGS-THOMSON Microelectronics assumes no responsability for the consequ ences of use of such information nor for any infringement of patents or other rights of third parties which may results from its use. No license is granted by implication or otherwise under any patent or patent rights of SGS-THOMSON Microelectronics. Specifications mentioned in this publication are subject to change without notice. This publication supersedes and replaces all information previously supplied. SGS-THOMSON Microelectronics products are not authorized for use as critical compone in life support devices or systems without express nts written approval of SGS-THOMSON Microelectonics. (c) 1996 SGS-THOMSON Microelectronics - Printed in Italy - All Rights Reserved SGS-THOMSON Microelectronics GROUP OF COMPANIES Australia - Brazil - Canada - China - France - Germany - Hong Kong - Italy - Japan - Korea - Malaysia - Malta - Morocco - The Netherlands Singapore - Spain - Sweden - Switzerland - Taiwan - Thailand - United Kingdom - U.S.A . 13/13 |
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